DEVELOPMENT OF METHOD FOR IMPROVING IDENTIFICATION SYSTEMS RELIABILITY USING SRAM PUF AS IDENTIFIER
https://doi.org/10.37493/2307-910X.2021.2.9
Abstract
The article presents the research results of degradation effect on memory cells while used as PUF carrier. To reduce degradation, author proposed and experimentally evaluated new cell recovery methods which increases reliability of identification systems that use SRAM PUF stable cells as an identifier carrier.
References
1. Golanbari M. S. [и др.]. Reliable memory PUF design for low-power applications IEEE Computer Society, 2018.C. 207-213.
2. Karimi N. [и др.]. Impact of the switching activity on the aging of delay-PUFs Institute of Electrical and Electronics Engineers Inc., 2017.
3. Maes R. Physically unclonable functions: Constructions, properties and applications / R. Maes, Springer-Verlag Berlin Heidelberg, 2013. 1-185 c.
4. Maes R., Leest V. Van Der Countering the effects of silicon aging on SRAM PUFs IEEE Computer Society, 2014.C. 148-153.
5. Wang R. [и др.]. Long-term Continuous Assessment of SRAM PUF and Source of Random Numbers Institute of Electrical and Electronics Engineers Inc., 2020.C. 7-12.
Review
For citations:
Aliev G.S. DEVELOPMENT OF METHOD FOR IMPROVING IDENTIFICATION SYSTEMS RELIABILITY USING SRAM PUF AS IDENTIFIER. Modern Science and Innovations. 2021;(2):101-106. (In Russ.) https://doi.org/10.37493/2307-910X.2021.2.9
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